Energia Indonesia Material support facilities – Scanning Electron Microscope
What is Scanning Electron Microscope (SEM)?
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, and produces various signals that contain information about the surface topography and composition of the sample (wiki)
Why engineering needs Scanning Electron Microscope?
Material and metallurgy investigation is a mandatory to observe failure, to inspect material – specification, type and grade.
Combination SEM with our FEA services
our expertise and experience is to scan electron microscope result combined with finite element method to explain root cause failure and potential risk with actual based data.
Please contact us for details inquiry.